Determination of the compositions of the DIGM zone in nanocrystalline Ag/Au and Ag/Pd thin films by secondary neutral mass spectrometry

• Gábor Y. Molnár,
• Shenouda S. Shenouda,
• Gábor L. Katona,
• Gábor A. Langer and
• Dezső L. Beke

Beilstein J. Nanotechnol. 2016, 7, 474–483, doi:10.3762/bjnano.7.41

• ][19][20] it was indicated that the compositions in the DIGM zones can be determined by secondary neutral mass spectrometry (SNMS) depth profiling. It was shown that i) as it was illustrated in the Cu/Ni system already in 1983 [21], alloying can also take place in the faster component, similarly as in

• × 10−3 Pa) in the temperature range of 150–280 °C for different times. Concentration–depth profiles were determined by measuring the intensity (cps) as a function of the sputtering time (s) using secondary neutral mass spectrometry (SNMS, INA-X, SPECS GmbH, Berlin) equipment. The intensity–sputtering

Formation of Cu_xAu_1−x phases by cold homogenization of Au/Cu nanocrystalline thin films

• Alona Tynkova,
• Gabor L. Katona,
• Gabor A. Langer,
• Sergey I. Sidorenko,
• Svetlana M. Voloshko and
• Dezso L. Beke

Beilstein J. Nanotechnol. 2014, 5, 1491–1500, doi:10.3762/bjnano.5.162

• intermetallic compounds; secondary neutral mass spectrometry (SNMS); solid state reaction; Introduction Solid-state reactions in nanostructured thin film systems are interesting and challenging not only from the point of view of pure fundamental research, but are also important for technological applications